Publications

“Identification and Evaluation of a Dynamic Model for a Thin Film Deposition Process,” C. Oguz and M. A. Gallivan, Proceedings of the 2007 American Control Conference, (2007) 4124-4129. Abstract
“Moving horizon estimation for in situ monitoring of chemical vapor deposition process,” R. Xiong and M. A. Gallivan, Proceedings of the 2007 American Control Conference, (2007) 3648-3653. Abstract
“Identification of a dynamic model for a thin film deposition process using a self-organizing map,” C. Oguz and M. A. Gallivan, Proceedings of the 2006 IEEE International Joint Conference on Neural Networks (2006). Abstract
“An extended Kalman filter for in-situ sensing of yttria-stabilized zirconia in chemical vapor deposition,” R. Xiong, P. J. Wissmann, and M. A. Gallivan, Proceedings of Chemical Process Control 7 (2006). Abstract PDF
“Modeling and characterization of dielectrophoretic assembly process for nanobelts,” P. J. Hesketh, M. A. Gallivan, S. Kumar, C. J. Erdy, and Z. L. Wang, Proceedings of the 2005 ASME International Mechanical Engineering Congress and Exposition (2005). Abstract PDF
“Complexity reduction of a thin film deposition model using a trajectory based nonlinear model reduction technique,” P. Wolfrum, A. Vargas, M. A. Gallivan, and F. Allgower, Proceedings of the 2005 American Control Conference, (2005) 2566-2571. Abstract PDF
“The application of dielectrophoresis to nanowire sorting and assembly for sensors,” P. J. Hesketh, M. A. Gallivan, S. Kumar, C. J. Erdy, and Z. L. Wang, Proceedings of the 2005 Mediterranean Conference on Control and Automation (2005) 153-158. Abstract PDF
“Dynamics of materials processing at the molecular scale,” C. Oguz and M. A. Gallivan, Proceedings of the 2004 International Symposium on Nonlinear Theory and its Applications (2004) 135-138. Abstract PDF
''Low-order dynamics in a lattice model of thin film deposition, using nonlinear principal component analysis,'' M. A. Gallivan, in Proceedings of Dynamics and Control of Process Systems (2004). Abstract PDF
"Optimization, estimation, and control for kinetic Monte Carlo simuations of thin film deposition," M. A. Gallivan, in Proceedings of the Conference on Decision and Control (2003) 3437-3442. Abstract PDF
"Model reduction and system identification for master equation control systems," M. A. Gallivan and R. M. Murray, in Proceedings of the American Control Conference (2003) 3561-3566. Abstract PDF
"MBE and modeling studies of pulsed growth on Ge(001)," M. A. Gallivan and H. A. Atwater, in Morphological and Compositional Evolution of Thin Films, vol. 749, Materials Research Society (2002). Abstract PDF
"Modeling and control of thin film morphology using unsteady processing parameters: problem formulation and initial results," M. A. Gallivan, D. G. Goodwin, and R. M. Murray, in Proceedings of the 40th IEEE Conference on Decision and Control (2001) 1570-1576. Abstract PDF
"The dynamics of thin film growth: a modeling study," M. A. Gallivan, R. M. Murray, and D. G. Goodwin, in CVD XV: Proceedings of the Fifteenth Symposium on Chemical Vapor Deposition, (M. D. Allendorf and M. L. Hitchman, eds.), vol. 616, Electrochemical Society (2000) 168-175. Abstract PDF
"A stagnation-flow MOCVD reactor for intelligent deposition of YBCO thin films," A. B. Tripathi, D. A. Boyd, M. A. Gallivan, H. A. Atwater, R. M. Murray, and D. G. Goodwin, in CVD XV: Proceedings of the Fifteenth Symposium on Chemical Vapor Deposition, (M. D. Allendorf and M. L. Hitchman, eds.), vol. 616, Electrochemical Society (2000) 240-247.
"Kinetic Monte Carlo simulations of dynamic phenomena in thin film growth," M. A. Gallivan, R. M. Murray, and D. G. Goodwin, in New Methods, Mechanisms, and Models of Vapor Deposition (H. N. G. Wadley, G. H. Gilmer, and W. G. Barker, eds.), vol. 2000-13, Materials Research Society (2000) 61-66. Abstract PDF
"Real-time in-situ curvature measurement during growth of epitaxial YBCO films on MgO, D. A. Boyd, M. A. Gallivan, A. B. Tripathi, A. J. Rosakis, D. G. Goodwin, and H. A. Atwater, in New Methods, Mechanisms, and Models of Vapor Deposition (H. N. G. Wadley, G. H. Gilmer, and W. G. Barker, eds.), vol. 2000-13, Materials Research Society (2000) 109-114.
"A design study for thermal control of a CVD reactor for YBCO," M. A. Gallivan, D. G. Goodwin, and R. M. Murray, in Proceedings of the 1998 IEEE International Conference on Control Applications (1998) 1194-1199. Abstract PDF



Journal Publications “Optimization of a thin film deposition process using a dynamic model extracted from molecular simulations,” C. Oguz, and M. A. Gallivan, submitted to Automatica. “Interpretation of molecular structure and kinetics in melt condensation of A2 oligomers, B3 monomers, and monofunctional reagents,” C. Oguz, S. Unal, T. E. Long, and M. A. Gallivan, Macromolecules, in press. “An extended Kalman filter for in-situ sensing of yttria-stabilized zirconia in chemical vapor deposition,” R. Xiong, P. J. Wissmann, and M. A. Gallivan, Computers and Chemical Engineering, 30 (2006), 1657-1669. “A data-driven approach for reduction of molecular simulations,” C. Oguz and M. A. Gallivan, International Journal of Robust and Nonlinear Control, 15 (2005), 727-743. "Understanding the structure development in hyperbranched polymers prepared by oligomeric A2+B3 approach: comparison of experimental results and simulations," S. Unal, C. Oguz, E. Yilgor, M. A. Gallivan, T. E. Long and I. Yilgor, Polymer, 46 (2005), 4533-4543. "An estimation study for control of a lattice model of thin film deposition," M. A. Gallivan, Computers & Chemical Engineering 29 (2005), 761-769. "Effective transition rates for epitaxial growth using fast modulation," M. A. Gallivan, D. G. Goodwin, and R. M. Murray, Physical Review B, 70 (2004) 045409. "Reduction and identification methods for Markovian control systems, with application to thin film deposition," M. A. Gallivan and R. M. Murray, International Journal of Robust and Nonlinear Control (special issue: Control of Complex Process Systems), 14 (2004) 113-132. "Design of a film surface roughness-minimizing molecular beam epitaxy process by reduced-order modeling of epitaxial growth," M. A. Gallivan and H. A. Atwater, Journal of Applied Physics, 95 (2004) 483-489. "An evaluation of the bounce-back boundary condition for lattice Boltzmann simulations," M. A. Gallivan, D. R. Noble, J. G. Georgiadis, and R. O. Buckius, International Journal of Numerical Methods in Fluids, 25 (1997) 249-263. Peer-Reviewed Conference Proceedings “Identification and Evaluation of a Dynamic Model for a Thin Film Deposition Process,” C. Oguz and M. A. Gallivan, Proceedings of the 2007 American Control Conference, (2007) 4124-4129. Abstract “Moving horizon estimation for in situ monitoring of chemical vapor deposition process,” R. Xiong and M. A. Gallivan, Proceedings of the 2007 American Control Conference, (2007) 3648-3653. Abstract “Identification of a dynamic model for a thin film deposition process using a self-organizing map,” C. Oguz and M. A. Gallivan, Proceedings of the 2006 IEEE International Joint Conference on Neural Networks (2006). Abstract “An extended Kalman filter for in-situ sensing of yttria-stabilized zirconia in chemical vapor deposition,” R. Xiong, P. J. Wissmann, and M. A. Gallivan, Proceedings of Chemical Process Control 7 (2006). Abstract PDF “Modeling and characterization of dielectrophoretic assembly process for nanobelts,” P. J. Hesketh, M. A. Gallivan, S. Kumar, C. J. Erdy, and Z. L. Wang, Proceedings of the 2005 ASME International Mechanical Engineering Congress and Exposition (2005). Abstract PDF “Complexity reduction of a thin film deposition model using a trajectory based nonlinear model reduction technique,” P. Wolfrum, A. Vargas, M. A. Gallivan, and F. Allgower, Proceedings of the 2005 American Control Conference, (2005) 2566-2571. Abstract PDF “The application of dielectrophoresis to nanowire sorting and assembly for sensors,” P. J. Hesketh, M. A. Gallivan, S. Kumar, C. J. Erdy, and Z. L. Wang, Proceedings of the 2005 Mediterranean Conference on Control and Automation (2005) 153-158. Abstract PDF “Dynamics of materials processing at the molecular scale,” C. Oguz and M. A. Gallivan, Proceedings of the 2004 International Symposium on Nonlinear Theory and its Applications (2004) 135-138. Abstract PDF ''Low-order dynamics in a lattice model of thin film deposition, using nonlinear principal component analysis,'' M. A. Gallivan, in Proceedings of Dynamics and Control of Process Systems (2004). Abstract PDF "Optimization, estimation, and control for kinetic Monte Carlo simuations of thin film deposition," M. A. Gallivan, in Proceedings of the Conference on Decision and Control (2003) 3437-3442. Abstract PDF "Model reduction and system identification for master equation control systems," M. A. Gallivan and R. M. Murray, in Proceedings of the American Control Conference (2003) 3561-3566. Abstract PDF "MBE and modeling studies of pulsed growth on Ge(001)," M. A. Gallivan and H. A. Atwater, in Morphological and Compositional Evolution of Thin Films, vol. 749, Materials Research Society (2002). Abstract PDF "Modeling and control of thin film morphology using unsteady processing parameters: problem formulation and initial results," M. A. Gallivan, D. G. Goodwin, and R. M. Murray, in Proceedings of the 40th IEEE Conference on Decision and Control (2001) 1570-1576. Abstract PDF "The dynamics of thin film growth: a modeling study," M. A. Gallivan, R. M. Murray, and D. G. Goodwin, in CVD XV: Proceedings of the Fifteenth Symposium on Chemical Vapor Deposition, (M. D. Allendorf and M. L. Hitchman, eds.), vol. 616, Electrochemical Society (2000) 168-175. Abstract PDF "A stagnation-flow MOCVD reactor for intelligent deposition of YBCO thin films," A. B. Tripathi, D. A. Boyd, M. A. Gallivan, H. A. Atwater, R. M. Murray, and D. G. Goodwin, in CVD XV: Proceedings of the Fifteenth Symposium on Chemical Vapor Deposition, (M. D. Allendorf and M. L. Hitchman, eds.), vol. 616, Electrochemical Society (2000) 240-247. "Kinetic Monte Carlo simulations of dynamic phenomena in thin film growth," M. A. Gallivan, R. M. Murray, and D. G. Goodwin, in New Methods, Mechanisms, and Models of Vapor Deposition (H. N. G. Wadley, G. H. Gilmer, and W. G. Barker, eds.), vol. 2000-13, Materials Research Society (2000) 61-66. Abstract PDF "Real-time in-situ curvature measurement during growth of epitaxial YBCO films on MgO, D. A. Boyd, M. A. Gallivan, A. B. Tripathi, A. J. Rosakis, D. G. Goodwin, and H. A. Atwater, in New Methods, Mechanisms, and Models of Vapor Deposition (H. N. G. Wadley, G. H. Gilmer, and W. G. Barker, eds.), vol. 2000-13, Materials Research Society (2000) 109-114. "A design study for thermal control of a CVD reactor for YBCO," M. A. Gallivan, D. G. Goodwin, and R. M. Murray, in Proceedings of the 1998 IEEE International Conference on Control Applications (1998) 1194-1199. Abstract PDF Ph.D. Thesis Modeling and Control of Epitaxial Thin Film Growth. Abstract PDF